In situ angle-resolved photoemission spectroscopy measurements of cuprate thin films grown by molecular beam epitaxy

Utilizing the oxide molecular beam epitaxy (MBE) in situ connected to beam-line angle-resolved photoemission spectroscopy (ARPES) in Stanford Synchrotron Radiation Lightsource (SSRL), high-quality cuprate films grown atomic-layer-by-layer enable measurements of electronic structure tuned by various parameters, such as epitaxial strain and surface termination, which have not been possible before with bulk materials. With the in situ connected scanning tunneling microscopy (STM), we are able to further resolve electronic properties of these films in spatial dimensions. In this talk, the newest results coming from this interconnected system will be presented.