Bulletin of the American Physical Society
APS March Meeting 2019
Volume 64, Number 2
Monday–Friday, March 4–8, 2019; Boston, Massachusetts
Session A11: Defects in Semiconductors -- 1D, 2D, and Layered Materials
8:00 AM–10:48 AM,
Monday, March 4, 2019
BCEC
Room: 152
Sponsoring
Units:
DMP DCOMP FIAP
Chair: Annemarie Exarhos, Lafayette College
Abstract: A11.00001 : Nanoscale Conductivity Measurements of Biased Silicon Nanowires with Infrared Near-Field Optical Microscopy
8:00 AM–8:12 AM
Presenter:
Clayton Casper
(Chemistry, University of North Carolina at Chapel Hill)
Authors:
Clayton Casper
(Chemistry, University of North Carolina at Chapel Hill)
Earl T Ritchie
(Chemistry, University of North Carolina at Chapel Hill)
David J Hill
(Chemistry, University of North Carolina at Chapel Hill)
Taylor S Teitsworth
(Chemistry, University of North Carolina at Chapel Hill)
Samuel Berweger
(National Institute of Standards and Technology)
James F Cahoon
(Chemistry, University of North Carolina at Chapel Hill)
Joanna M Atkin
(Chemistry, University of North Carolina at Chapel Hill)
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