Bulletin of the American Physical Society
APS March Meeting 2018
Volume 63, Number 1
Monday–Friday, March 5–9, 2018; Los Angeles, California
Session T60: Poster Session III
1:00 PM,
Thursday, March 8, 2018
LACC
Room: West Hall A
Abstract ID: BAPS.2018.MAR.T60.45
Abstract: T60.00045 : Charged Electrospray Beam Optics in the Focusing Column
Presenter:
Elham Vakil Asadollahei
(Mechanical and Aerospace Engineering, University of California, Irvine)
Authors:
Elham Vakil Asadollahei
(Mechanical and Aerospace Engineering, University of California, Irvine)
Manuel Gamero-Castaño
(Mechanical and Aerospace Engineering, University of California, Irvine)
We studied the optics of charged ES beam in electrostatic field of an experimental apparatus. A numerical simulation of projectile trajectory in the axisymmetric electrostatic field determines the Gaussian image of the source. In addition to tracing algorithms, numerical models of potential error sources, geometric and chromatic aberrations, are used to inspect the bombarded area on silicon targets for a range of accelerating voltages. The deviated size and shape of the sputtered area from Gaussian image is used to track the imperfections in the experimental setup and the inherent properties of the beam. In our presentation we discuss how each of these aberration components affects the resolution, and can be corrected or minimized using additional elements such as multipole lenses.
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2018.MAR.T60.45
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