Bulletin of the American Physical Society
APS March Meeting 2018
Volume 63, Number 1
Monday–Friday, March 5–9, 2018; Los Angeles, California
Session T60: Poster Session III
1:00 PM,
Thursday, March 8, 2018
LACC
Room: West Hall A
Abstract ID: BAPS.2018.MAR.T60.308
Abstract: T60.00308 : Numerical Investigation of Topography's Role During Conductive Atomic Force Microscope mapping of Organic Semiconductors*
Presenter:
REZA PEJMAN
(Mechanical Engineering, State University of New York at Binghamton)
Authors:
REZA PEJMAN
(Mechanical Engineering, State University of New York at Binghamton)
Yongfeng Liang
(State Key Laboratory for Advanced Metals and Materials, University of Science and Technology Beijing)
Junpin Lin
(State Key Laboratory for Advanced Metals and Materials, University of Science and Technology Beijing)
Congrui Jin
(Mechanical Engineering, State University of New York at Binghamton)
*This work is supported by State Key Laboratory for Advanced Metals and Materials (2017-ZD03), University of Science and Technology Beijing, Beijing, China.
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2018.MAR.T60.308
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