Bulletin of the American Physical Society
APS March Meeting 2018
Monday–Friday, March 5–9, 2018; Los Angeles, California
Session H56: Advanced Morphological Characterization of Polymeric Materials II: Emerging Microscopy and Spectroscopy Techniques
2:30 PM–5:30 PM,
Tuesday, March 6, 2018
LACC Room: 515B
Sponsoring Unit: DPOLY
Chair: Brian Collins, Washington State Univ
Abstract: H56.00008 : nano-FTIR: Near-Field Spectroscopy of Polymers with sub-20nanometer Spatial Resolution
4:42 PM–4:54 PM
Scattering-type scanning near-field optical microscopy (s-SNOM) has emerged as one of the key technologies to study the optical properties of physical, chemical and biological materials on the 10-nm length scale – far beyond the diffraction limit of light. Utilizing the strong confinement of the optical near-field at the apex of a sharp metal atomic-force microscope the tip, this technology is capable of detection the complex valued dielectric function of the materials directly below the tip. This way important information about the samples absorption and reflectivity can be extracted at the nanoscale. With the development of Fourier transform infrared spectroscopy on the nanoscale (nano-FTIR) and hyperspectral nanospectroscopy, we have successfully extended s-SNOM towards a complete spectroscopic analysis tool that is capable of analyzing complex polymer nanostructures, embedded structural phases in biominerals, organic semiconductors and two-dimensional materials. In this presentation we will introduce the basic principle of near-field microscopy, nano-FTIR spectroscopy and hyperspectral nanoscopy and address their impact and key applications in the field polymer characterization.
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