Electronic Properties of Defects in Few-Layer MoS<sub>2</sub> Films

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APS March Meeting 2018

Volume 63, Number 1

Monday–Friday, March 5–9, 2018; Los Angeles, California

Session F35: Adatoms, Dopants, and Defects in 2D Materials

11:15 AM–2:15 PM, Tuesday, March 6, 2018
LACC Room: 409B

Sponsoring Unit: DCMP
Chair: Cory Cress, US Naval Research Laboratory

Abstract ID: BAPS.2018.MAR.F35.9

Abstract: F35.00009 : Electronic Properties of Defects in Few-Layer MoS₂ Films*

12:51 PM–1:03 PM

Abstract

Presenter:

Marcus Forst
(Physics Department, Temple University)

Authors:

Marcus Forst
(Physics Department, Temple University)

Daniel Trainer
(Physics Department, Temple University)

Marian Precner
(Physics Department, Drexel University)

Tomas Polakovic
(Physics Department, Drexel University)

Qiao Qiao
(Condensed Matter Physics & Materials Science Department, Brookhaven National Laboratory)

Yimei Zhu
(Condensed Matter Physics & Materials Science Department, Brookhaven National Laboratory)

Xiaoxing Xi
(Physics Department, Temple University)

Goran Karapetrov
(Physics Department, Drexel University)

Maria Iavarone
(Physics Department, Temple University)

We report on structural and electronic properties of defects in chemical vapor-deposited monolayer and few-layer MoS₂ films. Scanning tunneling microscopy, Kelvin probe force microscopy, and transmission electron microscopy were used to obtain quantitative measurements of the local density of states, work function and nature and mobility of defects. These defects include point defects such as S and Mo vacancies as well as extended defects such as film edges and grain boundaries.

*This work was supported as part of the CCDM, an Energy Frontier Research Center funded by the U.S. Department of Energy, Office of Science under Award #DE-SC0012575.
The electron microscopy facilities at BNL were supported by the Materials Science and Engineering Divisions, Office of Basic Energy Sci

To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2018.MAR.F35.9

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Bulletin of the American Physical Society

APS March Meeting 2018

Volume 63, Number 1

Monday–Friday, March 5–9, 2018; Los Angeles, California

Session F35: Adatoms, Dopants, and Defects in 2D Materials

Abstract: F35.00009 : Electronic Properties of Defects in Few-Layer MoS2 Films*

Presenter:

Authors:

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Abstract: F35.00009 : Electronic Properties of Defects in Few-Layer MoS₂ Films*