Bulletin of the American Physical Society
APS March Meeting 2018
Volume 63, Number 1
Monday–Friday, March 5–9, 2018; Los Angeles, California
Session H40: Properties of Carbon Nanotubes
2:30 PM–5:30 PM,
Tuesday, March 6, 2018
LACC
Room: 501C
Sponsoring
Unit:
DCMP
Chair: Masa Ishigami, Univ of Central Florida
Abstract ID: BAPS.2018.MAR.H40.1
Abstract: H40.00001 : Automated circuit fabrication and direct characterization of carbon nanotubes vibrations - Optical imaging of CNTs
2:30 PM–2:42 PM
Presenter:
Yuval Yaish
(Electrical Engineering, Technion)
Authors:
Yuval Yaish
(Electrical Engineering, Technion)
Gilad Zeevi
(Electrical Engineering, Technion)
Michael Shlafman
(Electrical Engineering, Technion)
Tal Tabachnik
(Electrical Engineering, Technion)
Zeev Rogachevsky
(Electrical Engineering, Technion)
Sharon Rechnitz
(Electrical Engineering, Technion)
Israel Goldshtein
(Electrical Engineering, Technion)
Shlomo Shlafman
(Electrical Engineering, Technion)
Here1 we present a simple, rapid, non-invasive, and scalable technique that enables optical imaging of CNT. We utilize the CNTs scaffold to serve as a seed for nucleation and growth of small size, optically visible, nano-crystals. These nano-crystals can be removed completely after imaging, leaving the surface intact and thus the CNT electrical and mechanical properties are preserved. The successful and robust optical imaging allowed us to develop a dedicated image processing algorithm through which we are able to demonstrate a fully automated circuit design resulting in field effect transistors and inverters.
Moreover, we demonstrate that this imaging method allows not only to locate CNTs but also to study the dynamic mechanical motion of suspended ones. The decorated tubes exhibit linear as well as nonlinear Duffing type behavior, as well as transition from hardening to softening nonlinearity.
1 G. Zeevi, et al., Nature Communications 7, 12153 doi: 10.1038/ncomms12153 (2016)
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2018.MAR.H40.1
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