Bulletin of the American Physical Society
APS March Meeting 2017
Volume 62, Number 4
Monday–Friday, March 13–17, 2017; New Orleans, Louisiana
Session C28: Dopants and Defects in Semiconductors II: Oxides
2:30 PM–5:30 PM,
Monday, March 13, 2017
Room: 291
Sponsoring
Units:
DMP FIAP DCOMP
Chair: Zhigang Gui, University of Arkansas
Abstract ID: BAPS.2017.MAR.C28.4
Abstract: C28.00004 : Scanning Probe Microscopy Investigation of H-irradiated ZnO and Co-doped ZnO thin films in dark and UV-light conditions
3:30 PM–3:42 PM
Preview Abstract Abstract
Authors:
D. D'Agostino
(Physics Department E.R. Caianiello, University of Salerno, IT)
C. Di Giorgio
(Physics Department E.R. Caianiello, University of Salerno, IT)
F. Bobba
(Physics Department E.R. Caianiello, University of Salerno, IT)
A. Di Trolio
(CNR-IS, U.O.S. di Tor Vergata, Rome, IT; LNF, INFN, Rome, IT)
A. Amore Bonapasta
(CNR-ISM, Rome, IT)
P. Alippi
(CNR-ISM, Rome, IT)
A. Polimeni
(Physics Department, Sapienza University, Rome, IT)
A.M. Cucolo
(Physics Department E.R. Caianiello, University of Salerno, IT)
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2017.MAR.C28.4
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