Bulletin of the American Physical Society
APS March Meeting 2016
Volume 61, Number 2
Monday–Friday, March 14–18, 2016; Baltimore, Maryland
Session L7: Dopants and Defects in Semiconductors: Novel experimental techniques
11:15 AM–2:15 PM,
Wednesday, March 16, 2016
Room: 303
Sponsoring
Units:
DMP FIAP
Chair: James Speck, University of California, Santa Barbara
Abstract ID: BAPS.2016.MAR.L7.11
Abstract: L7.00011 : \textbf{Profiling the local carrier concentration and dopant distribution across a semiconductor quantum dot}
1:39 PM–1:51 PM
Preview Abstract Abstract
Authors:
J.C. Walrath
(Univ of Michigan - Ann Arbor)
A.S. Chang
(Univ of Michigan - Ann Arbor)
Y.H. Lin
(Univ of Michigan - Ann Arbor)
S. Huang
(Univ of Michigan - Ann Arbor)
R.S. Goldman
(Univ of Michigan - Ann Arbor)
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2016.MAR.L7.11
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