Session H37: SPS Undergraduate Research III
8:00 AM–11:00 AM, Tuesday, February 28, 2012
Room: 108
Sponsoring Unit:
SPS
Chair: Gary White, AIP/SPS
Abstract ID: BAPS.2012.MAR.H37.5
Abstract: H37.00005 : Pushing the Limits of Nanoscale Imaging in Atomic Force Microscopy
8:48 AM–9:00 AM
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Abstract 
Authors:
Jacob Cvetich
(Clarion University)
Vasudeva Rao Aravind
(Clarion University)
Benjamin Legum
(Clarion University)
The invention of scanning probe microscopy has revolutionized the field of nanotechnology. Atomic force microscopy is a branch of scanning probe microscopy in which an extremely sharp tip ($\sim $50 nm diameter) is held in contact with a sample surface. By maintaining constant force between the tip and the sample, the topography of a sample surface can be measured with high precision. The lateral resolution in this technique is however limited by the size of the tip. In this presentation, we present a method to deconvolve the effect of tip size and obtain higher resolution than presented by the experimentally obtained topographic image.
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2012.MAR.H37.5