### Session H37: SPS Undergraduate Research III

8:00 AM–11:00 AM, Tuesday, February 28, 2012
Room: 108

Chair: Gary White, AIP/SPS

Abstract ID: BAPS.2012.MAR.H37.5

### Abstract: H37.00005 : Pushing the Limits of Nanoscale Imaging in Atomic Force Microscopy

8:48 AM–9:00 AM

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#### Authors:

Jacob Cvetich
(Clarion University)

Vasudeva Rao Aravind
(Clarion University)

Benjamin Legum
(Clarion University)

The invention of scanning probe microscopy has revolutionized the field of nanotechnology. Atomic force microscopy is a branch of scanning probe microscopy in which an extremely sharp tip ($\sim$50 nm diameter) is held in contact with a sample surface. By maintaining constant force between the tip and the sample, the topography of a sample surface can be measured with high precision. The lateral resolution in this technique is however limited by the size of the tip. In this presentation, we present a method to deconvolve the effect of tip size and obtain higher resolution than presented by the experimentally obtained topographic image.

To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2012.MAR.H37.5