Bulletin of the American Physical Society
APS March Meeting 2011
Volume 56, Number 1
Monday–Friday, March 21–25, 2011; Dallas, Texas
Abstract: K1.00017 : Spatio-temporal beam profiling of pulsed infrared laser sources
Author:
Development of viable infrared lasers relies not only on the power and
wavelength generated by the source, but also on the spatial and temporal
profile of the output beam. Thermal imaging is of particular interest to
researchers working in the field of optically pumped semiconductor analysis
as the output from many of these devices falls in the mid-infrared range.
While knife edge and other beam profile analysis techniques typically are
unable to capture the temporal evolution of beam profiles, real time imaging
is employed in this work, using a thermal camera synchronized with a Nd:YAG
pump laser via LabVIEW-controlled triggering. Coupling the synchronization
with detailed image analysis using IDL, this new methodology is applied to
the near-infrared output of an optical parametric oscillator and ultimately
will be extended to mid-infrared semiconductor lasers.
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2011.MAR.K1.17
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