Bulletin of the American Physical Society
APS March Meeting 2011
Volume 56, Number 1
Monday–Friday, March 21–25, 2011; Dallas, Texas
Abstract: C1.00209 : Low Temperature Scanning Probe Microscope(LT-SPM) operating in a Cryogen-Free Cryostat, 1.5-300K
Author:
We present the design of a Low Temperature Scanning Probe
Microscope(LT-SFM)
operating in a vibration-free cryogen-free cryostat. A 0.5W ultra
now noise
Pulse Tube cryocooler is integrated into the cryostat with a 9T
magnet.
Stick slip coarse approach mechanism is used to bring the sample
in to close
proximity of the sample. The sample can be moved in XY directions
within 3
mm range, while the position is measured with capacitive encoder
with 3$\mu
$m accuracy. An improved fiber interferometer with $\sim
$12fm/$\surd $Hz
noise level is used to detect cantilever deflection. The
resonance of the
cantilever controlled by a digital Phase Locked Loop (PLL)
integrated in our
Control Electronics with 5mHz frequency resolution. We can
achieve $\sim
$1nm resolution in AFM mode {\&} $<$10nm resolution in MFM mode.
Results
from different imaging modes; non-contact AFM, MFM, Piezoresponse,
Conductive AFM etc. will be presented.
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2011.MAR.C1.209
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