Bulletin of the American Physical Society
APS March Meeting 2011
Volume 56, Number 1
Monday–Friday, March 21–25, 2011; Dallas, Texas
Abstract: C1.00199 : Apparatus for the analysis of surfaces in gas environments using Positron Spectroscopy
Author:
Positron spectroscopy performed with low energy beams can provide
highly
surface specific information due to the trapping of positrons in
an image
potential surface state at the time of annihilation. Here we
present design
details of a new positron beam system for the analysis of
surfaces gas
environments. The new system will employ differential pumping to
transport
the positrons most of the way from the source to the sample under
high
vacuum. The positrons will then be transported through a thin gas
layer
surrounding the sample. The positrons will be implanted into the
sample at
energies less than $\sim $10 keV ensuring that a large fraction
will diffuse
back to the surface before annihilation. The Elemental content of
the
surface interacting with the gas environment will then be
determined from
the Doppler broadened gamma spectra.
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2011.MAR.C1.199
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