### Session Y39: Focus Session: Imaging and Interfaces in Energy Science

8:00 AM–10:48 AM, Friday, March 25, 2011
Room: A124/127

Chair: Annabella Selloni, Princeton University

Abstract ID: BAPS.2011.MAR.Y39.1

### Abstract: Y39.00001 : Imaging Interfacial Structure and Reactivity with X-ray Reflectivity and Microscopy

8:00 AM–8:36 AM

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#### Author:

Paul Fenter
(Argonne National laboratory)

A fundamental understanding of interfacial reactions is best achieved with ability to observe the systems of interest directly, ideally with molecular-scale resolution and/or sensitivities. X-ray-based approaches offer broad opportunities for probing complex interfaces in environments (e.g., liquids) that are normally inaccessible. I will describe two complimentary approaches for imaging interfaces. The first, X-ray reflection interface microscopy (XRIM), uses the weak interface-reflected X-ray beam to image laterally heterogeneous interfacial structures and processes using a full-field imaging approach. This approach incorporates all of the sensitivities of X-ray reflectivity (XR, including sensitivity to interfacial topography, structure and composition) as potential contrast mechanisms. Recent applications of XRIM will be described, including the abilities to observe: elementary surface topography (i.e., 6.5 {\AA}-high steps) with $\sim$100 nm spatial resolution; interfacial reactivity; and liquid-solid interfaces, in-situ. A second, complementary, approach images the vertical distributions of element-specific sub-structures at an interface through the use of resonant dispersion at X-ray energies close to element's absorption edge (resonant anomalous X-ray reflectivity, RAXR). Recent applications of RAXR will be described including the ability to image element-specific distributions (i.e., ions near a charged liquid-solid interface) and its sensitivity for probing oxidation state specific structures at interfaces. The use of these techniques to observe charge transport at interfaces with respect to energy-related processes will be discussed.

To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2011.MAR.Y39.1