Session Index

Session J15: Focus Session: Advances in Scanned Probe Microscopy II: Optical Techniques

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Sponsoring Units: GIMS
Chair: Andreas Heinrich, IBM Almaden Research Center
Room: B114


Tuesday, March 16, 2010
11:15AM - 11:51AM

J15.00001: Laser-combined STM and probing ultrafast transient dynamics
Invited Speaker: Hidemi Shigekawa

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Tuesday, March 16, 2010
11:51AM - 12:03PM

J15.00002: Measuring nanorod diffusion in 3D with holographic video microscopy
Fook Chiong Cheong , David Grier

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Tuesday, March 16, 2010
12:03PM - 12:15PM

J15.00003: ABSTRACT WITHDRAWN


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Tuesday, March 16, 2010
12:15PM - 12:27PM

J15.00004: Spectroscopy of single emitters using a scanning optical microscope in a dilution refrigerator
Saikat Ghosh , Colin Heikes , Frank Wise , Alexander Gaeta , Dan Ralph

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Tuesday, March 16, 2010
12:27PM - 12:39PM

J15.00005: High RF Magnetic Field Near-Field Microwave Microscope
Tamin Tai , Dragos I. Mircea , Steven M. Anlage

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Tuesday, March 16, 2010
12:39PM - 12:51PM

J15.00006: Observation of atomically resolved HOPG and Au surfaces in ambient conditions using the microwave channels of a hybrid STM/microwave microscope based on a resonant microwave cavity
Jonghee Lee , Christian J. Long , Haitao Yang , Ichiro Takeuchi

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Tuesday, March 16, 2010
12:51PM - 1:03PM

J15.00007: Nano-imaging in the black-body infrared near-field.
Andrew C. Jones , Markus B. Raschke

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Tuesday, March 16, 2010
1:03PM - 1:15PM

J15.00008: Plasmonic focusing on a tip for spectroscopic nano-imaging
Samuel Berweger , Catalin C. Neacsu , Robert L. Olmon , Laxmikant V. Saraf , Claus Ropers , Markus B. Raschke

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Tuesday, March 16, 2010
1:15PM - 1:27PM

J15.00009: Dual Mode AFM/Ellipsometer Imaging
Jianghua Bai , John Freeouf , Andres La Rosa

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Tuesday, March 16, 2010
1:27PM - 1:39PM

J15.00010: Phonon resonant spectroscopic recognition of 4 nm silicon nitride particles by infrared near field microscopy
Yohannes Abate , Johannes Stiegler , Yaroslav Romanyuk , Andy Huber , Stephen Leone , Rainer Hillenbrand

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Tuesday, March 16, 2010
1:39PM - 1:51PM

J15.00011: Effect of probe-sample gap atmosphere on shear-force distance feedback using a near-field scanning microwave microscope
Nikolai Kalugin , Lee Wickey , Vladimir Talanov

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Tuesday, March 16, 2010
1:51PM - 2:03PM

J15.00012: Development of a scanning microwave microscope for localized ferromagnetic resonance measurements
Christian J. Long , Stephen A. Kitt , Jonghee Lee , Samuel Lofland , Ichiro Takeuchi

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Tuesday, March 16, 2010
2:03PM - 2:15PM

J15.00013: Near-field Optical Measurement using Nano-Prism Probes
Taekyeong Kim , Byung Yang Lee , Kwang Heo , Seunghun Hong , Ki Seok Jeon , Hyung Min Kim , Yung Doug Suh , Deok Soo Kim , Zee Hwan Kim

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