Bulletin of the American Physical Society
APS March Meeting 2010
Volume 55, Number 2
Monday–Friday, March 15–19, 2010; Portland, Oregon
Session K1: Poster Session II (2:00 pm - 5:00 pm)
Tuesday, March 16, 2010
Room: Exhibit CD
Abstract ID: BAPS.2010.MAR.K1.6
Abstract: K1.00006 : Raman imaging of defects in single-layer and multi-layer graphene
Preview Abstract Abstract
Graphene is a two-dimensional crystal that has caught the attention of many research groups around the world. Raman spectroscopy is commonly used to identify single and multi-layer graphene. We report on the use of Raman imaging as a tool for studying structural defects in graphene. We focus on identifying defects and observing defect evolution using this technique.
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2010.MAR.K1.6
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