Bulletin of the American Physical Society
APS March Meeting 2010
Volume 55, Number 2
Monday–Friday, March 15–19, 2010; Portland, Oregon
Session K1: Poster Session II (2:00 pm - 5:00 pm)
Tuesday, March 16, 2010
Room: Exhibit CD
Abstract ID: BAPS.2010.MAR.K1.140
Abstract: K1.00140 : Microstructure and Electron Transport in ZnO:Al Thin Films
Preview Abstract Abstract
Transparent, conducting ZnO:Al thin films deposited by sputtering may figure prominently in emerging opto-electronics and energy conversion technologies. However, there remain significant unanswered questions regarding the relationship between the microstructure of sputtered ZnO:Al films and the fundamental electronic transport properties. We will present initial results of a study which aims to address some of these questions by using microscopic probes to measure the effect of grain boundaries on electron transport in reactively sputtered films. Particular emphasis will be on how oxygen concentration affects local electron conduction.
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2010.MAR.K1.140
The American Physical Society (APS) is a non-profit membership organization working to advance the knowledge of physics.
1 Physics Ellipse, College Park, MD 20740-3844
Editorial Office 1 Research Road, Ridge, NY 11961-2701 (631) 591-4000
Office of Public Affairs 529 14th St NW, Suite 1050, Washington, D.C. 20045-2001 (202) 662-8700