Bulletin of the American Physical Society
APS March Meeting 2010
Volume 55, Number 2
Monday–Friday, March 15–19, 2010; Portland, Oregon
Session B15: Focus Session: Advances in Scanned Probe Microscopy I: Novel AFM, MRFM, and Acoustic Microscopy
11:15 AM–2:15 PM,
Monday, March 15, 2010
Sponsoring Unit: GIMS
Chair: Robert McMichael, National Institute of Standards and Technology
Abstract ID: BAPS.2010.MAR.B15.1
Abstract: B15.00001 : Probing bias-strain coupling on the nanoscale by Piezoresponse Force Microscopy: from ferroelectric and multiferroics to energy storage materials*
11:15 AM–11:51 AM
Preview Abstract Abstract
(Oak Ridge National Laboratory)
Coupling between the electric fields and strains is ubiquitous on the nanoscale, ranging from piezoelectricity and electrostriction in piezo- and ferroelectrics to complex phenomena mediated by the changes in mobile ion concentration in intercalation compounds and collective Jahn-Teller distortions coupled to oxidation states in correlated oxides. In this presentation, I will summarize recent advances in Piezoresponse Force Microscopy applied for studies of bias-induced phase transitions in ferroelectrics and multiferroics, and demonstrate potential for mapping polarization switching on a single defect level. Phase-field modeling allows the corresponding mesoscopic mechanisms to be deciphered, and further suggests strategies for (symmetry forbidden) manipulation of in-plane polarization component. Controlled creation of ferroelectric closure domains is demonstrated. In the second part of the talk, I will demonstrate applications of spectroscopic PFM for mapping Li-ion dynamics and diffusion in energy storage materials and devices, potentially extending PFM for studies of nanoscale phenomena in an extremely broad range of materials beyond ferroelectrics.
*Work supported by the DOE Division of Scientific User Facilities.
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2010.MAR.B15.1
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