### Session Q33: Focus Session: Complex Oxide Thin Films -- Oxide/Semiconductor Interfaces and Defects

11:15 AM–2:15 PM, Wednesday, March 17, 2010
Room: E143

Chair: Susanne Stemmer, University of California, Santa Barbara

Abstract ID: BAPS.2010.MAR.Q33.9

### Abstract: Q33.00009 : Nanometer-scale striped surface terminations on fractured SrTiO$_{3}$ surfaces

1:15 PM–1:27 PM

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#### Authors:

Jeffrey Guest
(Argonne National Laboratory)

Nathan Guisinger
(Argonne National Laboratory)

Tiffany Santos
(Argonne National Laboratory)

Te-Yu Chien
(Argonne National Laboratory)

Anand Bhattacharya
(Argonne National Laboratory)

John Freeland
(Argonne National Laboratory)

Matthias Bode
(Argonne National Laboratory)

Using cross-sectional scanning tunneling microscopy on in situ fractured SrTiO$_{3}$, one of the most commonly used substrates for the growth of complex oxide thin films and superlattices, atomically smooth terraces have been observed on (001) surfaces. Furthermore, it was discovered that fracturing this material at room temperature results in the formation of stripe patterned domains having characteristic widths (10 to 20 nm) of alternating surface terminations that extend over a long-range. Spatial characterization utilizing spectroscopy techniques revealed a strong contrast in the electronic structure of the two domains. Combining these results with topographic data, we are able to assign both TiO$_{2}$ and SrO terminations to their respective domains. The results of this experiment reveal that fracturing this material leads to reproducibly flat surfaces that can be characterized at the atomic-scale and suggests that this technique can be utilized for the study of technologically relevant complex oxide interfaces.

To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2010.MAR.Q33.9