Session A14: Focus Session: Transport Properties of Nanostructures I: Single-Molecule Junctions
8:00 AM–11:00 AM, Monday, March 15, 2010
Room: B113
Sponsoring Unit:
DMP
Chair: Latha Venkataraman, Columbia University
Abstract ID: BAPS.2010.MAR.A14.10
Abstract: A14.00010 : Excess Volltage-Dependent Noise in Atomic-Scale Au Contacts
10:36 AM–10:48 AM
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Abstract 
Authors:
Patrick Wheeler
(Department of Physics and Astronomy, Rice University)
Ruoyu Chen
(Department of Physics and Astronomy, Rice University)
Kenneth Evans
(Applied Physics Program, Rice University)
Jeffrey Russom
Nicholas King
(Department of Physics and Astronomy, Rice University)
Douglas Natelson
(Department of Physics and Astronomy, Rice University)
An atomic-scale metal contact shows nonlinear scaling of excess noise power with applied bias. While this excess noise scales more rapidly with voltage than the linear dependence expected from pure shot noise, we do observe clear suppression of the noise power at the first few conductance quanta, $G_{0}\equiv 2e^2/h$, $2G_{0}$, and $3G_{0}$. Using high frequency techniques, data is taken at room temperature in mechanical break junctions. We employ lock-in techniques combined with an rf amplifier chain to measure the excess noise power simultaneously with the dc conductance. We describe the dependence of the noise on bias voltage and analyze the noise vs. conductance histograms. This additional excess noise provides a possible probe for local electronic heating of the junction.
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2010.MAR.A14.10