Session Index

Session Y6: Industrial Advanced Characterizations

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Abstracts
Sponsoring Units: FIAP
Chair: Mark Disko, Exxon Mobile Research and Engineering Co.
Room: Morial Convention Center RO4


Friday, March 14, 2008
11:15AM - 11:51AM

 Y6.00001: Local strain analysis for CMOS technology by Raman and Nano-Raman spectroscopy
Invited Speaker: Michael Hecker

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Friday, March 14, 2008
11:51AM - 12:27PM

 Y6.00002: Hydrogen storage by physisorption on Metal Organic Frameworks
Invited Speaker: Anne Dailly

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Friday, March 14, 2008
12:27PM - 1:03PM

 Y6.00003: Characterization of the pore geometry of porous media and the saturating fluids using 2-dimensional diffusion - NMR relaxation measurements
Invited Speaker: Martin Dominik Hürlimann

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Friday, March 14, 2008
1:03PM - 1:39PM

 Y6.00004: Non- linear Optical Spectroscopy of Interfaces
Invited Speaker: Mohsen Yeganeh

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Friday, March 14, 2008
1:39PM - 2:15PM

 Y6.00005: Development of Silicide Contacts for CMOS devices: Advantages of using Synchrotron Radiation
Invited Speaker: Christian Lavoie

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