Thursday, March 13, 2008
11:15AM - 11:27AM
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V36.00001: High-resolution element-selective microscopy using X-ray enhanced Scanning Tunneling Microscopy
Volker Rose
, John Freeland
, Kenneth Gray
, Stephen Streiffer
, Matthias Bode
Preview Abstract |
Thursday, March 13, 2008
11:27AM - 11:39AM
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V36.00002: Scanning optical homodyne detection of high-frequency picoscale resonances in cantilever and tuning fork sensors
J. C. Randel
, G. Zeltzer
, A. K. Gupta
, R. Bashir
, S.-H. Song
, H. C. Manoharan
Preview Abstract |
Thursday, March 13, 2008
11:39AM - 11:51AM
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V36.00003: Radio Frequency Scanning Tunneling Microscopy: Instrumentation and Applications
Utku Kemiktarak
, Tchefor Ndukum
, Keith C. Schwab
, Kamil L. Ekinci
Preview Abstract |
Thursday, March 13, 2008
11:51AM - 12:03PM
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V36.00004: Thermomechanical Noise Measurements of Very High Frequency (VHF) Nanomechanical Resonators
Carl Hart IV
, Kamil Ekinci
Preview Abstract |
Thursday, March 13, 2008
12:03PM - 12:15PM
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V36.00005: Development of an Evanescent Microwave Probe / Scanning Tunneling Microscope to study Localized Electron Spin Resonance
Christian Long
, Naoyuki Taketoshi
, Ichiro Takeuchi
, Haitao Yang
, Xiao-Dong Xiang
Preview Abstract |
Thursday, March 13, 2008
12:15PM - 12:27PM
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V36.00006: High Frequency Piezoresponse Force Microscopy in the 1-10 MHz Regime
Katyayani Seal
, Stephen Jesse
, Brian Rodriguez
, Arthur Baddorf
, Sergei Kalinin
Preview Abstract |
Thursday, March 13, 2008
12:27PM - 12:39PM
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V36.00007: Contrast sensitive imaging with a cantilever-based near-field microwave probe
Keji Lai
, Worasom Kundhikanjana
, Michael Kelly
, Zhi-xun Shen
Preview Abstract |
Thursday, March 13, 2008
12:39PM - 12:51PM
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V36.00008: STM and SNOM Type of Scanning Probe Microscopes in the Same Unit: Towards Electrical Modification and Optical Characterization at Nanoscale
Ilya Sychugov
, Hiroo Omi
, Tooru Murashita
, Yoshihiro Kobayashi
Preview Abstract |
Thursday, March 13, 2008
12:51PM - 1:03PM
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V36.00009: A Unique Probe for Tip Enhanced Raman Scattering and Shadow NSOM
Aaron Lewis
, Hesham Taha
, Rimma Dekhter
, Galia Zinoviev
, Galina Fish
Preview Abstract |
Thursday, March 13, 2008
1:03PM - 1:15PM
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V36.00010: Chemical Imaging of the Surface of Polymeric Nanostructures Using Apertureless Near-Field IR Microscopy
Zahra Fakhraai
, Kerstin Mueller
, Melissa Paulite
, Xiujuan Yang
, Gilbert C. Walker
Preview Abstract |
Thursday, March 13, 2008
1:15PM - 1:27PM
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V36.00011: Scanning thermal microscopy with a fluorescent nanoprobe
Benjamin Samson
, Elika Saidi
, Lionel Aigouy
, Peter Low
, Beomjoon Kim
, Christian Bergaud
, Michel Mortier
Preview Abstract |
Thursday, March 13, 2008
1:27PM - 1:39PM
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V36.00012: A versatile technique for fabrication of SiC SPM probes
Joel Therrien
, Daniel Schmidt
, Sheetal Barrot
, Bhavin Patel
Preview Abstract |
Thursday, March 13, 2008
1:39PM - 1:51PM
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V36.00013: \textit{In-situ} broadband microwave calibrations and measurements using cryogenic probe stations
Jeffrey Lindemuth
, Scott Yano
Preview Abstract |
