Bulletin of the American Physical Society
2008 APS March Meeting
Volume 53, Number 2
Monday–Friday, March 10–14, 2008; New Orleans, Louisiana
Session V36: Advances in Scanned Probe Microscopy IV: Optical and High Frequency Methods
11:15 AM–1:51 PM,
Thursday, March 13, 2008
Morial Convention Center
Room: 228
Sponsoring
Unit:
GIMS
Chair: Phillip First, Georgia Institute of Technology
Abstract ID: BAPS.2008.MAR.V36.11
Abstract: V36.00011 : Scanning thermal microscopy with a fluorescent nanoprobe
1:15 PM–1:27 PM
Preview Abstract Abstract
Authors:
Benjamin Samson
(LPEM / CNRS)
Elika Saidi
(LPEM / CNRS)
Lionel Aigouy
(LPEM / CNRS)
Peter Low
(LAAS / CNRS)
Beomjoon Kim
(University of Tokyo, Japan)
Christian Bergaud
(LAAS /CNRS)
Michel Mortier
(ENSCP / CNRS)
Collaborations:
Laboratoire Photons Et Matiere, Laboratoire d'Architecture et d'Analyse des Systemes, Institute of Industrial Science, Center for International Research on MicroMechatronics, Laboratoire de Chimie de la Mati\`ere Condens\'ee de Paris
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2008.MAR.V36.11
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