Bulletin of the American Physical Society
2008 APS March Meeting
Volume 53, Number 2
Monday–Friday, March 10–14, 2008; New Orleans, Louisiana
Session V24: Focus Session: Transport in Nanostructures VII: Si Interfaces and Carbon
11:15 AM–1:51 PM,
Thursday, March 13, 2008
Morial Convention Center
Room: 216
Sponsoring
Unit:
DMP
Chair: Michael Fuhrer, University of Maryland
Abstract ID: BAPS.2008.MAR.V24.10
Abstract: V24.00010 : Direct measurement of electric-field-screening length in thin graphite film
1:03 PM–1:15 PM
Preview Abstract Abstract
Authors:
H. Miyazaki
(RIKEN and JST-CREST)
K. Tsukagoshi
(RIKEN, AIST, and JST-CREST)
S. Odaka
(RIKEN, Tokyo TECH, and JST-CREST)
Y. Aoyagi
(RIKEN, Tokyo TECH, and JST-CREST)
T. Sato
(Univ. of Tsukuba and JST-CREST)
S. Tanaka
(Univ. of Tsukuba and JST-CREST)
H. Goto
(Univ. of Tsukuba and JST-CREST)
A. Kanda
(Univ. of Tsukuba and JST-CREST)
Y. Ootuka
(Univ. of Tsukuba and JST-CREST)
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2008.MAR.V24.10
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