Tuesday, March 6, 2007
2:30PM - 2:42PM
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L41.00001: Gas cluster ion irradiation in formation of nano-ripple structures on silicon surfaces and its applications to producing III-nitride nanorods
O. Lozano
, X.M. Wang
, Q.Y. Chen
, J.R. Liu
, P.V. Chinta
, P.V. Wadekar
, Wei-Kan Chu
, H.W. Seo
, L.W. Tu
, Y.T. Lin
, Y.L. Cheng
Preview Abstract |
Tuesday, March 6, 2007
2:42PM - 2:54PM
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L41.00002: Studies of Ripple Formation on Si Surfaces During Ar$^{+}$ Ion Bombardment
Gozde Ozaydin
, Karl F. Ludwig
, Hua Zhou
, Randall L. Headrick
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Tuesday, March 6, 2007
2:54PM - 3:06PM
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L41.00003: Vertical Asymmetry and the Ripple Rotation Transition in the Epitaxial Growth and Erosion on (110) Crystal Surfaces
Leonardo Golubovic
, Artem Levandovsky
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Tuesday, March 6, 2007
3:06PM - 3:18PM
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L41.00004: Light scattering as a technique to probe grain boundary melting
Erik Thomson
, John Wettlaufer
, Larry Wilen
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Tuesday, March 6, 2007
3:18PM - 3:30PM
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L41.00005: Adatoms, Grain Boundaries, and Thin Film Growth Stress
Edmund Webb III
, Stephen Foiles
, Chun-Wei Pao
, David Srolovitz
, Jerrold Floro
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Tuesday, March 6, 2007
3:30PM - 3:42PM
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L41.00006: Grain-boundary grooving and agglomeration of alloy thin films: phase-field simulations
Mathieu Bouville
, Dongzhi Chi
, David J. Srolovitz
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Tuesday, March 6, 2007
3:42PM - 3:54PM
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L41.00007: Enhanced growth instability of strained film on curved substrate
Yu Zhang
, Hangyao Wang
, Feng Liu
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Tuesday, March 6, 2007
3:54PM - 4:06PM
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L41.00008: Si-Ge Intermixing and the 5x5-(111) Surface Reconstruction
Demetra Psiachos
, M. J. Stott
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Tuesday, March 6, 2007
4:06PM - 4:18PM
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L41.00009: Ti as an Interface Stabilizer for Fe/Al and Al/Fe Interfaces
W. Priyantha
, A. Comouth
, A. Kayani
, H. Chen
, M. Kopczyk
, R.J. Smith
, D. McCready
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Tuesday, March 6, 2007
4:18PM - 4:30PM
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L41.00010: Impurity Segregation at the Si/SiO$_{2}$ Interface
A. G. Marinopoulos
, K. van Benthem
, S. Rashkeev
, S. J. Pennycook
, S. T. Pantelides
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Tuesday, March 6, 2007
4:30PM - 4:42PM
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L41.00011: Temperature Induced Modifications of SiC Interfaces studied by High Resolution Electron Energy Loss Spectroscopy
J.A. Schaefer
, M. Eremtchenko
, J. Uhlig
, A. Neumann
, R. Oettking
, S.I.-U. Ahmed
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Tuesday, March 6, 2007
4:42PM - 4:54PM
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L41.00012: ABSTRACT HAS BEEN MOVED TO X19.00015
Preview Abstract |
Tuesday, March 6, 2007
4:54PM - 5:06PM
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L41.00013: Measurement of Young's modulus of thin films using modal characterization.
Dragoslav Grbovic
, Nickolay Lavrik
, Panos Datskos
Preview Abstract |
