Session Index

Session L38: Focus Session: Advances in Scanned Probe Microscopy I: Low Temperatures, Manipulation,and Optical Methods I

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Abstracts
Sponsoring Units: GIMS
Chair: Joseph Stroscio, National Institute of Standards and Technology
Room: Colorado Convention Center 501


Tuesday, March 6, 2007
2:30PM - 2:42PM

 L38.00001: An ultrahigh vacuum, variable temperature scanning tunneling microscope
E.W. Hudson , W.D. Wise , Kamalesh Chatterjee , M.C. Boyer

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Tuesday, March 6, 2007
2:42PM - 2:54PM

 L38.00002: Scanning tunneling microscopy in high magnetic fields below 1 Kelvin
Andreas Heinrich , Donald Eigler , Cyrus Hirjibehedin , Markus Ternes , Christopher Lutz

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Tuesday, March 6, 2007
2:54PM - 3:06PM

 L38.00003: Construction of a sub-Kelvin ultra-high vacuum scanning tunneling microscope in high magnetic field
Ungdon Ham , Xi Chen , Chi Chen , Freddy Toledo , Wilson Ho

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Tuesday, March 6, 2007
3:06PM - 3:18PM

 L38.00004: Design of a 20 mK/15 T STM system
Young Jae Song , Steve Blankenship , Jason Crain , Joseph Stroscio

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Tuesday, March 6, 2007
3:18PM - 3:30PM

 L38.00005: Atomistic constructions using a scanning tunneling microscope.
Aparna Deshpande , Joel Vaughn , Saw-Wai Hla

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Tuesday, March 6, 2007
3:30PM - 3:42PM

 L38.00006: Scanning Tunneling Microscope Manipulation of $\beta$-Carotene on Au(111) at 4.6 K
Timur Skeini , Violeta Iancu , Saw-Wai Hla

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Tuesday, March 6, 2007
3:42PM - 3:54PM

 L38.00007: Vertical Atom Manipulation on GaN(000$\overline 1 $) Surface at Low Temperature
Danda P. Acharya , Kendal Clark , Saw W. Hla

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Tuesday, March 6, 2007
3:54PM - 4:06PM

 L38.00008: Design and Construction of a UHV-LT-STM for Tip-Enhanced Optics.
D.R. Daughton , D. Lee , N. Ezeh , J.A. Gupta

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Tuesday, March 6, 2007
4:06PM - 4:18PM

 L38.00009: Stress Imaging in Indented Si Wafers by Confocal Raman Microscopy
Jeroen Schoenmaker , Robert F. Cook , Lukas Novotny , Stephan J. Stranick

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Tuesday, March 6, 2007
4:18PM - 4:30PM

 L38.00010: Tip Enhanced Raman Scattering of Strained Silicon with Single and Multiple Probe Scanned Probe Microscopes.
Aaron Lewis

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Tuesday, March 6, 2007
4:30PM - 4:42PM

 L38.00011: High Efficiency Surface Plasmon Enhanced Near-field Scanning Optical Microscope Probe Development.
R.E. Hollingsworth , G.J. Nuebel , I.C. Schick , P.D. Flammer , J.T. Martineau , M.A. Hurowitz , R.T. Collins

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Tuesday, March 6, 2007
4:42PM - 4:54PM

 L38.00012: A Silicon MEMS Probe Integrated with Light Emitting Nanoparticles on Tip for Near-field Scanning Optical Microscopy
X. Zhang , K. Hoshino , L. Rozanski , D. Vanden Bout

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Tuesday, March 6, 2007
4:54PM - 5:06PM

 L38.00013: Spectroscopic near-field microscopy using frequency combs in the mid-infrared
Markus Brehm , Albert Schliesser , Fritz Keilmann

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Tuesday, March 6, 2007
5:06PM - 5:18PM

 L38.00014: Element specific imaging by STM combined with synchrotron radiation light
Toyoaki Eguchi , Taichi Okuda , Takeshi Matsushima , Akira Kataoka , Ayumi Harasawa , Kotone Akiyama , Toyohiko Kinoshita , Yukio Hasegawa

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Tuesday, March 6, 2007
5:18PM - 5:30PM

 L38.00015: Waveguide Characterization Using Shear Force Scanning Optical Microscopy.
Rongjin Yan , G. Yuan , R. Pownall , K. Lear

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