Bulletin of the American Physical Society
2005 APS March Meeting
Monday–Friday, March 21–25, 2005; Los Angeles, CA
Session Y5: Parallel and High-Throughput Experimentation for the Physical Sciences: Methods, Applications and Technology Development |
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Sponsoring Units: FIAP Chair: Eric Amis, NIST Room: LACC 502B |
Friday, March 25, 2005 11:15AM - 11:51AM |
Y5.00001: Combinatorial method for materials screening and device optimization of thin layer opto-electronic devices Invited Speaker: A rapid materials screening and a combinatorial development of thin film multilayer electro-optical devices is essential for a fast research and development progress and the implementation of device structures into commercial products. A well-established and reliable film preparation technique within the required nanometer film thickness range is the vapor deposition. The presented combinatorial methods are based on the preparation of linear or steps gradient and the preparation of sectors of material combinations or device structures by using mask movements in combination with a substrate positioning. Both of the two principles are combined to obtain an infinite number of possible libraries with different complexity, which may differ in each sector by the layer thickness, the sequence of layers, and the material selection. In addition by simultaneous evaporation using two or more sources and varying the deposition rate material compositions can also be created. In this presentation we represent an overview of our work on the combinatorial material screening and combinatorial optimization of multilayer thin film organic electro-optical devices prepared by vapor deposition. This article covers results on organic light emitting devices (OLEDs), organic solar cells, the orientation behavior of formanisotropic functional molecules on alignment layers, and the in-situ preparation and orientation of rod like and thermally stable aromatic polyimides. \newline \newline In collaboration with Markus B\"ate, Christian Neuber, and Mukundan Thelakkat, Universit\"at Bayreuth, Makromolekulare Chemie I [Preview Abstract] |
Friday, March 25, 2005 11:51AM - 12:27PM |
Y5.00002: Sensor Platforms for High-Throughput Analysis of Materials Libraries Invited Speaker: The multidimensional nature of the interactions between the composition, process parameters, and end-use conditions of functional materials result in significant materials development challenges. To accelerate discovery and optimization of materials, combinatorial and high-throughput methods combine parallel materials synthesis with automated materials screening. Rapid materials characterization on microscale remains the key challenge. In this presentation, we will discuss our applications of microfabricated sensors for high-throughput characterization of combinatorial functional materials. Microfabricated sensors are an attractive addition to the infrastructure of analytical instruments for combinatorial materials science. Using several examples from our labs, we will demonstrate attractiveness of microfabricated sensors and importance of a proper selection of transduction principles. [Preview Abstract] |
Friday, March 25, 2005 12:27PM - 1:03PM |
Y5.00003: Gradient and High-Throughput Methods for the Accelerated Development of Nanomaterials and Nanometrology Invited Speaker: Increasingly, new materials are highly tailored towards specific applications, are formulated from many components, and exhibit behavior governed by a multitude of physical, chemical and processing factors. Accordingly, the discovery and optimization of materials are met by considerable challenges inherent to the understanding of large, complex parameter spaces. In this respect, combinatorial and high-throughput (C{\&}HT) approaches are advantageous, since they present the ability to rapidly assess materials properties over large parameter ranges. The NIST Combinatorial Methods Center (NCMC, see www.nist.gov/combi) specializes in the development of quantitative C{\&}HT measurement methods for materials research. In large part, the NCMC concentrates on continuous gradient (CG) combinatorial methods, which involve the fabrication and HT measurement of systems that gradually vary parameters over a single specimen, and which offer an alternative to the (often costly) robotics-driven C{\&}HT paradigm used by the pharmaceutical industry. CG techniques are particularly suited for materials science since they naturally produce thorough maps (e.g. continuous phase diagrams) that relate materials properties to chemical, compositional, physical and processing parameters. This presentation focuses on NCMC research applied to the advancement of polymer-based nanotechnology. Topics to be discussed include CG techniques for the design and optimization of self-assembled systems, ultra-thin films, and intelligent surfaces; and HT methods for measuring thin film morphology and mechanical properties. In addition, the application of CG methods to the advancement of nanometrology, specifically scanned probe microscopy, will be discussed. [Preview Abstract] |
Friday, March 25, 2005 1:03PM - 1:39PM |
Y5.00004: Combinatorial thin film methodology for rapid investigation of composition-structure-property relationship in complex multifunctional materials Invited Speaker: We have developed thin film composition spread techniques to map compositional phase diagrams of multicomponent functional materials. Various combinatorial thin film deposition techniques including pulsed laser deposition, co-sputtering, and electron-beam deposition are used to fabricate binary and ternary composition spreads of metal oxide systems and metallic alloy systems. A variety of rapid characterization tools are employed to track physical properties of the materials as a function of sweeping composition changes. They include scanning SQUID microscopy, scanning microwave microscopy, and x-ray microdiffraction. High-throughput mapping of phase diagrams allow identification of new compounds as well as rapid delineation of composition-structure-property relationships. One of our emphases in these studies is to systematically look for structural phase transitions/boundaries in phase diagrams since these regions often display onset or peaking of ferroic properties such as ferroelectricity and magnetism. Mapping these active physical properties as a function of composition is an integral part of understanding the underlying physical mechanisms of the properties. To date, we have applied our methodology to investigation of a number of multifunctional materials including ferromagnetic shape memory alloys and magnetoelectric materials. We have demonstrated the utility of composition spreads as compact integrated devices where continuously changing physical parameters are used as a basis for functionally broadband detector arrays. The role of informatics in the high-throughput experimentation will also be discussed. [Preview Abstract] |
Friday, March 25, 2005 1:39PM - 2:15PM |
Y5.00005: Invited Speaker: |
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