Bulletin of the American Physical Society
2005 APS March Meeting
Monday–Friday, March 21–25, 2005; Los Angeles, CA
Session W44: Microscopy: Near-field, X-ray, Optical, and Probe
2:30 PM–4:42 PM,
Thursday, March 24, 2005
LACC
Room: 518
Sponsoring
Unit:
GIMS
Chair: Joseph Stroscio, NIST
Abstract ID: BAPS.2005.MAR.W44.6
Abstract: W44.00006 : High-resolution scanning hall probe microscopy
3:30 PM–3:42 PM
Preview Abstract Abstract
Authors:
C.W. Hicks
M.A. Topinka
J.H. Bluhm
K.A. Moler
(Geballe Laboratory for Advanced Materials, Stanford University)
J.W. Guikema
(Laboratory of Atomic and Solid State Physics, Cornell University)
E. Zeldov
H. Shtrikman
(Department of Condensed Matter Physics, Weizmann Institute of Science)
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2005.MAR.W44.6
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