### Session K1: Poster Session II

2:00 PM–2:00 PM, Tuesday, March 22, 2005
LACC Room: Exhibit Hall 2:00-5:00pm

Abstract ID: BAPS.2005.MAR.K1.162

### Abstract: K1.00162 : Scaling roughness and transport properties correlation in manganite thin films

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#### Authors:

Juan Ram\'irez
Maria Elena G\'omez
Wilson L\'opera
Pedro Prieto
(Departamento de F\'isica, Universidad del Valle)

A scaling roughness study was done on digitized Atomic Force Microscope (AFM) images of La$_{2/3}$Ca$_{1/3}$MnO$_{3}$ thin films grown on (100) oriented SrTiO$_{3}$ substrates. The films were grown via sputtering technique at high oxygen pressures (mbar) and at substrate temperatures of 850 $^{\circ}$C. The films were characterized by resistivity measurements to determine the Curie temperature by the transition temperature from insulating to metallic phase. From digitized AFM-images and by using a specific self-designed algorithm, we statistically study the scaling roughness properties. We obtain quantitative values for the roughness parameters: interface width ($\sigma )$, correlation length ($\xi )$, and roughness exponent ($\alpha )$. The calculated $\alpha$-values are 0.85 $\pm$ 0.05, indicating a highly oriented growth mechanism. We analyzed the dependence of layer thickness (d) and image size (D) with the parameters describing roughness and founded that Curie-Temperature is correlated with the lateral correlation length whereas there is no correlation with the saturation roughness.

To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2005.MAR.K1.162