Session S44: Magnetic and Force Microscopy
2:30 PM–5:18 PM, Wednesday, March 23, 2005
LACC Room: 518
Sponsoring Unit:
GIMS
Chair: Mark Hersam, Northwestern University
Abstract ID: BAPS.2005.MAR.S44.2
Abstract: S44.00002 : Force-detected ESR from E$^\prime$ centers
2:42 PM–2:54 PM
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Abstract 
Authors:
Palash Banerjee
Yulu Che
K.C. Fong
Tim Mewes
Vidya Bhallamudi
Denis V. Pelekhov
P. Chris Hammel
(Ohio State University)
Magnetic Resonance Force Microscopy (MRFM) is a novel technique that combines magnetic resonance with scanned probe techniques. We report on low temperature force-detected electron spin resonance (ESR) signals from $E^\prime$-centers in fused silica (SiO$_2$). By utilizing the high gradients close to a micron sized SmCo ferromagnetic tip mounted on an AFM cantilever, spin resonance was observed from a sub- micron thick ``sensitive slice'' whose location can be varied with respect to the sample surface. E$^\prime$ centers at low temperatures ($<$ 10 K) are characterized by long spin-lattice relaxation times T$_1$ approaching a few seconds. The spins were adiabatically inverted at the appropriate frequency by means of microwave FM techniques and T$_1$ was studied as a function of field gradient. We also discuss the sensitivity of the microscope and ongoing efforts to improve it.
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2005.MAR.S44.2