Bulletin of the American Physical Society
2005 APS March Meeting
Monday–Friday, March 21–25, 2005; Los Angeles, CA
Session A18: Focus Session: Semiconductor Characterization
8:00 AM–11:00 AM,
Monday, March 21, 2005
LACC
Room: 406A
Sponsoring
Units:
FIAP GIMS
Chair: David Seiler, NIST
Abstract ID: BAPS.2005.MAR.A18.3
Abstract: A18.00003 : UV-Raman deformation coefficients in Si and SiGe alloys
8:48 AM–9:00 AM
Preview Abstract Abstract
Authors:
Michael Canonico
(Freescale Semiconductor)
Ran Liu
(Fudan University)
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2005.MAR.A18.3
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