Bulletin of the American Physical Society
68th Annual Gaseous Electronics Conference/9th International Conference on Reactive Plasmas/33rd Symposium on Plasma Processing
Volume 60, Number 9
Monday–Friday, October 12–16, 2015; Honolulu, Hawaii
Session IW3: Modeling and Simulation I
8:00 AM–9:30 AM,
Wednesday, October 14, 2015
Room: 305 AB
Chair: Ute Ebert, Eindhoven University of Technology
Abstract ID: BAPS.2015.GEC.IW3.1
Abstract: IW3.00001 : Numerical Uncertainty Estimation for Stochastic Particle-in-Cell Simulations Applied to Verification and Validation*
8:00 AM–8:30 AM
Preview Abstract Abstract
(Sandia National Laboratories)
Numerical error estimation is a key component in verification, validation, and uncertainty quantification. For ParticleIn-Cell (PIC) plasma simulations, error estimation is complicated due to the presence of stochastic noise and multiple convergence parameters (grid size, time step, macro particle weight). In this talk, we will discuss recent developments for the Stochastic Richardson Extrapolation Based Error Quantification method (StREEQ). This method at its core is a multi-regression technique, where nine regression models and multiple bootstrap samples propagate uncertainties due to the fit and the stochasticity of the underlying data for an appropriate error model with unknown convergence rates. Recently, automation of the convergence parameter domain selection has been implemented; this enables efficient error estimation for large data sets, including analysis of multiple quantities of interest and time dependent data. This method is demonstrated for verification of both steady and time-periodic electron diodes, as well as validation of radiation generated plasma in an end-radiated cylinder.\\[4pt] In collaboration with Gregg Radtke, Sandia National Laboratories.
*Sandia National Laboratories is a multi-program laboratory managed and operated by Sandia Corporation, a wholly owned subsidiary of Lockheed Martin Corporation, for the U.S. DOE's National Nuclear Security Administration under contract DE-AC04-94AL85000.
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2015.GEC.IW3.1
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