Session R14: Experimental Techniques V
12:50 PM–2:34 PM, Tuesday, November 22, 2011
Room: 317
Chair: Gary Settles, Pennsylvania State University
Abstract ID: BAPS.2011.DFD.R14.4
Abstract: R14.00004 : Toward an automated background oriented schlieren (BOS) system
1:29 PM–1:42 PM
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Abstract 
Authors:
Michael Hargather
(Gas Dynamics Laboratory, Penn State University)
Gary Settles
(Penn State University)
The background oriented schlieren (BOS) technique is a useful method for visualizing refractive disturbances in a wide range of experimental settings. The technique visualizes refractive disturbances via their distortion of a distant background pattern (typically a speckle pattern). A cross-correlation computer algorithm is typically used to identify and measure distortions of the background pattern, thus revealing the refractive disturbance changes between images and producing a schlieren image. The cross-correlation algorithm, however, can be time-consuming and prevents an instantaneous schlieren image from being observed, thus hampering some potential BOS applications. Here a novel background patterning approach is presented which eliminates the need for the cross-correlation algorithm. Results are presented showing the sensitivity of the new background pattern and its potential application for providing instantaneous BOS images. Background pattern characteristics are explored for high- and low-speed fluid-dynamic applications.
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2011.DFD.R14.4